Figure 1: Calculated [0001] diffraction pattern of a model CdS nanocrystal of hexagonal wurtzite structure and 9 nm in diameter at the pixel resolution of 0.0067 Å −1. Figure 3: Sub-ångström imaging ...

The authors discuss the valuable information that can be obtained from indexing and its applications in routine screening and analysis of solid forms. Crystal-structure determination using X-ray ...

In the field of scanning electron microscopy (SEM), the electron backscatter diffraction (EBSD) method has developed into a robust tool for the crystallographic analysis of materials. Specifically, ...

When a sample fluoresces during a powder x-ray diffraction (XRD) experiment, the resulting errors in the quantitative results may render the experiment meaningless. Fluorescence is especially common ...