The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...
The semiconductor market is evolving, with devices becoming more complex as chip designers add cores and pursue 2.5D and 3D integration strategies. This complexity presents challenges extending from ...
SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...
Instron—USA offers 6800 Series universal testing systems, with capacities ranging from 500 N to 300 kN. These systems deliver exceptional performance while maintaining unrivaled reliability and ...
Any switching system can connect A to B. Only a well-designed one delivers top performance. Well-designed test systems have a minimum of three major subsystems: computing, instrumentation, and ...
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